Micro-nano scale particle defects on micro channel plate field emission effect and control technology research

Chen Wang; Lin Mei; Zhenyu Zhou; Sanzhao Wang; Chang Liu; Kaiyu Li; Xiaofeng Tang; Tiezhu Bo; Hui Liu; Jingbo Liu

doi:10.1117/12.2580221

5 November 2020 Micro-nano scale particle defects on micro channel plate field emission effect and control technology research

Chen Wang, Lin Mei, Zhenyu Zhou, Sanzhao Wang, Chang Liu, Kaiyu Li, Xiaofeng Tang, Tiezhu Bo, Hui Liu, Jingbo Liu

Author Affiliations +

Proceedings Volume 11567, AOPC 2020: Optical Sensing and Imaging Technology; 115673Q (2020) https://doi.org/10.1117/12.2580221
Event: Applied Optics and Photonics China (AOPC 2020), 2020, Beijing, China

Abstract

Micro-nano project by studying the micro channel plate surface micro convex particle sizes can produce a phenomenon of point discharge which causes the field emission, and particles on the surface on the micro channel plate mechanism, then through metallographic microscope classification and testing for different particle morphology, finally three kinds of particle preparation is be determined. Through the study, by water to remove the ultrasonic repeatedly can get rid of polishing powder residue. And acid etching process of silica particles by adding alkali ultrasonic frequency and the use of high frequency ultrasound alternately can be completely removed. Then through evaporation before increasing ion bombardment can effectively control the micro convex particles which is produced after evaporation electrod. Through the study, by water to remove the ultrasonic repeatedly can get rid of polishing powder residue. And acid etching process of silica particles by adding alkali ultrasonic frequency and the use of high frequency ultrasound alternately can be completely removed. Then through evaporation before increasing ion bombardment can effectively control the micro convex particles which is produced after evaporation electrod.

Citation Download Citation

Chen Wang, Lin Mei, Zhenyu Zhou, Sanzhao Wang, Chang Liu, Kaiyu Li, Xiaofeng Tang, Tiezhu Bo, Hui Liu, and Jingbo Liu "Micro-nano scale particle defects on micro channel plate field emission effect and control technology research", Proc. SPIE 11567, AOPC 2020: Optical Sensing and Imaging Technology, 115673Q (5 November 2020); https://doi.org/10.1117/12.2580221

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