CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11581 > Article
Paper
14 October 2020 Optical system recognition via topological methods
Yuriy S. Kurskoy, Oleksandr S. Hnatenko, Yuriy P. Machekhin, Mykhaylo V. Neofitnyi, Valeriy I. Zarytskyi, Waldemar Wójcik, Sandugash Orazalieva, Saule Smailova
Author Affiliations +
Proceedings Volume 11581, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2020; 115810M (2020) https://doi.org/10.1117/12.2580362
Event: Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2020, 2020, Wilga, Poland
Abstract
The aim of the paper is to create a topological model for the detection and recognition of hidden optical surveillance systems. The model is based on fractal insights about the structure of the optical signal and determination of the fractal dimension intensity distribution in a cross-sectional plane of the laser pulse reflected from the target. It is shown that the approximation of the fractal dimension value to unity is a prerequisite to the target classification as an optical surveillance device. In order to classify the type of an optical device along with the fractal dimension the group of the fractal characteristics, consisting of the type of fractal signatures, the type of spatial spectrum and the values of spatial frequency that characterize the signal structure must be developed.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Yuriy S. Kurskoy, Oleksandr S. Hnatenko, Yuriy P. Machekhin, Mykhaylo V. Neofitnyi, Valeriy I. Zarytskyi, Waldemar Wójcik, Sandugash Orazalieva, and Saule Smailova "Optical system recognition via topological methods", Proc. SPIE 11581, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2020, 115810M (14 October 2020); https://doi.org/10.1117/12.2580362
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Fractal analysis
On-screen displays
Optical components
Systems modeling
Laser systems engineering
Reflectivity
Video
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top