Poster + Presentation
22 February 2021 ArF lightsource “GT66A” for next-generation immersion lithography enhancing EPE and CD performance
Toshihiro Oga, Shinichi Matsumoto, Taku Yamazaki, Takeshi Ohta, Satoru Bushida
Author Affiliations +
Conference Poster
Abstract
A newly designed ArF immersion lightsource, GT66A is required to provide yield improvement on highly complexed multiple-patterning lithography and additional productivity to the chip makers. The DUV lightsource prospective, EPE needed to be paid attention in order to reduce LER/ LWR, Line Narrowing Module (LNM) demonstrates E95% stability improvement providing further OVL/ CDU improvement. In order to improve tool availability, GT66A key modules including LNM provides up to 50% expected life extension. Therefore, GT66A enables to provide high in availability with improved optical property for EPE enhancement simultaneously.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toshihiro Oga, Shinichi Matsumoto, Taku Yamazaki, Takeshi Ohta, and Satoru Bushida "ArF lightsource “GT66A” for next-generation immersion lithography enhancing EPE and CD performance", Proc. SPIE 11613, Optical Microlithography XXXIV, 116130T (22 February 2021); https://doi.org/10.1117/12.2583729
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KEYWORDS
Immersion lithography

Line width roughness

Temporal coherence

Scanners

Semiconducting wafers

Speckle

Thermal effects

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