Synthetic aperture gradient light interference microscopy (SA-GLIM) for high throughput label-free imaging

Chenfei Hu; Mikhail Kandel; Yuchen He; Young Jae Lee; Gabriel Popescu

doi:10.1117/12.2584226

5 March 2021 Synthetic aperture gradient light interference microscopy (SA-GLIM) for high throughput label-free imaging

Chenfei Hu, Mikhail Kandel, Yuchen He, Young Jae Lee, Gabriel Popescu

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Proceedings Volume 11653, Quantitative Phase Imaging VII; 1165309 (2021) https://doi.org/10.1117/12.2584226
Event: SPIE BiOS, 2021, Online Only

Abstract

We propose synthetic aperture gradient light interference microscopy (SA-GLIM) as a solution to avoid computational complexity in standard Fourier pytchographic microscopy. This new system combines direct phase measurements from GLIM with various illumination angles, and a synthetic aperture reconstruction method, to produce high resolution, large FOV quantitative phase maps. Using a 5× objective lens (NA = 0.15), SA-GLIM generates phase maps with a spatial resolution of 850 nm and FOV approximately 1.7×1.7 mm2. We tested the performance using a mixture of polystyrene beads (1 μm and 3 μm in diameter), and the smaller beads can be easily resolved in the final image. Compared with standard FPM, SA-GLIM records substantially fewer low-resolution images, which makes the data throughput highly efficient.

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Chenfei Hu, Mikhail Kandel, Yuchen He, Young Jae Lee, and Gabriel Popescu "Synthetic aperture gradient light interference microscopy (SA-GLIM) for high throughput label-free imaging", Proc. SPIE 11653, Quantitative Phase Imaging VII, 1165309 (5 March 2021); https://doi.org/10.1117/12.2584226

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KEYWORDS

Microscopy

Synthetic aperture radar

Spatial resolution

Computer architecture

Computing systems

Image resolution

Image restoration

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