Paper
12 March 2021 The research on the effect of spectral distributions on specular gloss measurement
Author Affiliations +
Proceedings Volume 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications; 117638B (2021) https://doi.org/10.1117/12.2587578
Event: Seventh Symposium on Novel Photoelectronic Detection Technology and Application 2020, 2020, Kunming, China
Abstract
Specular gloss is the perception by an observer of the shiny appearance of a surface. This perception changes whenever there is a change in the relative position or spectral distribution of the source, the sample, or the observer. However, the spectral distribution of the source in ISO 2813 is CIE standard illuminant C, which is different from CIE standard illuminant D65 and CIE standard illuminant A in JJG696-2015. During the measurement, the reflected flux of the sample is influenced by the luminous reflectance of the sample and the spectral distribution of the source. This paper mainly analyses the influence of different spectral distributions on specular gloss measurement. Combined with the luminous reflectance of the sample in the wavelength range from400nm to 760nm, we theoretically and experimentally analyzed the difference of the specular gloss values under the spectral distributions of CIE standard illuminant D65 and CIE standard illuminant A.
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Muyao Ji, Tiecheng Li, and Fangsheng Lin "The research on the effect of spectral distributions on specular gloss measurement", Proc. SPIE 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications, 117638B (12 March 2021); https://doi.org/10.1117/12.2587578
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