Presentation
1 August 2021 Multi-slice ptychography for continuous object within the depth of field
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Abstract
Ptychography has become a popular technique for high-throughput and high-resolution characterization of 2D/3D materials. When objects introduce significantly large phase shifts, a multi-slice model needs to be considered to account for long-distance wave propagation within the sample. Although many groups have demonstrated multi-slice ptychography using specimens that are several times larger than the depth of field (DOF), the benefits of applying the multi-slice ptychography algorithm on small objects within the DOF is rarely discussed. Here we address this question and demonstrate that multi-slice ptychography can play an important role in improving reconstruction quality for continuous objects that are smaller than the DOF.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yi Jiang, Junjing Deng, Yudong Yao, Jeffrey A. Klug, Zhonghou Cai, Barry Lai, and Stefan Vogt "Multi-slice ptychography for continuous object within the depth of field", Proc. SPIE 11839, X-Ray Nanoimaging: Instruments and Methods V, 118390E (1 August 2021); https://doi.org/10.1117/12.2594882
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