Paper
7 December 2021 Novel time domain ptychography, i2PIE, for improved contrast in nonlinear microscopy
George Dwapanyin, Dirk Spangenberg, Thomas Feurer, Alexander Heidt, Gurthwin Bosman, Pieter Neethling, Erich Rohwer
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Abstract
We present a novel nonlinear microscopy modality using a time-domain ptychographic phase measurement, i2PIE, to compress 80 MHz supercontinuum pulses from an ANDi PCF used as excitation source, improving contrast at reduced average power.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
George Dwapanyin, Dirk Spangenberg, Thomas Feurer, Alexander Heidt, Gurthwin Bosman, Pieter Neethling, and Erich Rohwer "Novel time domain ptychography, i2PIE, for improved contrast in nonlinear microscopy", Proc. SPIE 11922, Advances in Microscopic Imaging III, 119220O (7 December 2021); https://doi.org/10.1117/12.2615717
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KEYWORDS
Phase measurement

Image compression

Microscopy

Curium

Phase shift keying

Signal to noise ratio

Image enhancement

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