CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 12144 > Article
Presentation + Paper
27 May 2022 Focal field engineered infrared-sensitive third-order sum frequency generation microscopy
Jyothsna Konkada Manattayil, Lal Krishna A. S., Hyunmin Kim, Varun Raghunathan
Author Affiliations +
Proceedings Volume 12144, Biomedical Spectroscopy, Microscopy, and Imaging II; 121440K (2022) https://doi.org/10.1117/12.2621764
Event: SPIE Photonics Europe, 2022, Strasbourg, France
Abstract
In this work we present experimental demonstration of focal-field engineering in infrared-sensitive third-order sum frequency generation (TSFG) microscopy by utilizing beam-shaping technique. Two photons of the input mid-infrared (MIR) beam at 3000 nm are upconverted to 615 nm in the presence of a single photon at 1040 nm through the TSFG process. The focal-field engineering scheme studied here improves optical resolution and contrast of the TSFG imaging. We observe best improvement of ~43 % in the central-lobe full-width half diameter with ~35% side-lobe strength of that of the central-lobe with the use of optimum phase-mask using isolated amorphous silicon (a-Si) nano disks as the sample. We compare the contrast enhancement between the experiments and simulations as a function of varying grating pitch and find good overall agreement between the two. In addition to annular phase masks, we also demonstrate edge contrast enhancement by imaging gratings with higher-order Hermite-Gaussian beams profile generated using horizontally partitioned 0-𝜋 phase profile.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Jyothsna Konkada Manattayil, Lal Krishna A. S., Hyunmin Kim, and Varun Raghunathan "Focal field engineered infrared-sensitive third-order sum frequency generation microscopy", Proc. SPIE 12144, Biomedical Spectroscopy, Microscopy, and Imaging II, 121440K (27 May 2022); https://doi.org/10.1117/12.2621764
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES + PRESENTATION
DOWNLOAD PAPER SAVE TO MY LIBRARY
WATCH
PRESENTATION
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microscopy
Sum-frequency generation
Infrared imaging
Polarization
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top