Laser scanning confocal microscopy observations of InAsSb thin and thick epilayers

Yu Zhu Gao; Xiu Ying Gong; Zun Tian Chen; Minoru Niigaki; Tadanobu Koyama; Yasuhiro Hayakawa

doi:10.1117/12.2611065

15 February 2022 Laser scanning confocal microscopy observations of InAsSb thin and thick epilayers

Yu Zhu Gao, Xiu Ying Gong, Zun Tian Chen, Minoru Niigaki, Tadanobu Koyama, Yasuhiro Hayakawa

Proceedings Volume 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021); 1216619 (2022) https://doi.org/10.1117/12.2611065
Event: Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 2021, Hong Kong, Hong Kong

Abstract

InAs_0.92Sb_0.08 and InAs_0.06Sb_0.94 epilayers have been grown on InAs substrates by liquid phase epitaxy (LPE) and melt epitaxy (ME) respectively. InAsSb epilayers grown by LPE and ME have been firstly observed by a high temperature laser scanning confocal microscopy (LSCM) . X-ray diffraction (XRD) measurements confirmed that the lattice constant of InAs_0.92Sb_0.08 epilayers grown by LPE is 6.0912 Å, while that of InAs_0.06Sb_0.94 epilayers grown by ME is 6.4520 Å. Uncooled photoconductors were fabricated using InAs0.06Sb0.94 thick epilayers grown by ME. The photoresponse wavelength range of InAs_0.06Sb_0.94 detectorsis 2-10 μm. At 295 K, the peak detectivity D_λp* is 3.59 × 10⁹ cm Hz^1/2W^-1 at the wavelength of 6.5 μm, and the detectivity D* is 1.0 × 10⁹ , 2.1 × 10⁸ and 1.0 × 10⁸ cm Hz^1/2W^-1 at 8, 9 and 10 μm for the detectors with Ge immersion lenses respectively

Citation Download Citation

Yu Zhu Gao, Xiu Ying Gong, Zun Tian Chen, Minoru Niigaki, Tadanobu Koyama, and Yasuhiro Hayakawa "Laser scanning confocal microscopy observations of InAsSb thin and thick epilayers", Proc. SPIE 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 1216619 (15 February 2022); https://doi.org/10.1117/12.2611065

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available