Poster + Paper
27 August 2022 Developing a new generation of integrated micro-spec far-infrared spectrometers for the experiment for cryogenic large-aperture intensity mapping (EXCLAIM)
Carolyn G. Volpert, Emily M. Barrentine, Mona Mirzaei, Alyssa Barlis, Alberto D. Bolatto, Berhanu T. Bulcha, Giuseppe Cataldo, Jake A. Connors, Nicholas Costen, Negar Ehsan, Thomas Essinger-Hileman, Jason Glenn, James P. Hays-Wehle, Larry A. Hess, Alan J. Kogut, Harvey Moseley, Jonas Mugge-Durum, Omid Noroozian, Trevor M. Oxholm, Maryam Rahmani, Thomas Stevenson, Eric R. Switzer, Joeseph Watson, Edward J. Wollack
Author Affiliations +
Conference Poster
Abstract
The current state of far-infrared astronomy drives the need to develop compact, sensitive spectrometers for future space and ground-based instruments. Here we present details of the μ-Spec spectrometers currently in development for the far-infrared balloon mission EXCLAIM. The spectrometers are designed to cover the 555 – 714 μm range with a resolution of R = λ/Δλ = 512 at the 638 μm band center. The spectrometer design incorporates a Rowland grating spectrometer implemented in a parallel plate waveguide on a low-loss single-crystal Si chip, employing Nb microstrip planar transmission lines and thin-film Al kinetic inductance detectors (KIDs). The EXCLAIM μ-Spec design is an advancement upon a successful R = 64 μ-Spec prototype, and can be considered a sub-mm superconducting photonic integrated circuit (PIC) that combines spectral dispersion and detection. The design operates in a single M=2 grating order, allowing one spectrometer to cover the full EXCLAIM band without requiring a multi-order focal plane. The EXCLAIM instrument will fly six spectrometers, which are fabricated on a single 150 mm diameter Si wafer. Fabrication involves a flipwafer-bonding process with patterning of the superconducting layers on both sides of the Si dielectric. The spectrometers are designed to operate at 100 mK, and will include 355 Al KID detectors targeting a goal of NEP ∼8 × 10−19 W/√ Hz. We summarize the design, fabrication, and ongoing development of these μ-Spec spectrometers for EXCLAIM.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carolyn G. Volpert, Emily M. Barrentine, Mona Mirzaei, Alyssa Barlis, Alberto D. Bolatto, Berhanu T. Bulcha, Giuseppe Cataldo, Jake A. Connors, Nicholas Costen, Negar Ehsan, Thomas Essinger-Hileman, Jason Glenn, James P. Hays-Wehle, Larry A. Hess, Alan J. Kogut, Harvey Moseley, Jonas Mugge-Durum, Omid Noroozian, Trevor M. Oxholm, Maryam Rahmani, Thomas Stevenson, Eric R. Switzer, Joeseph Watson, and Edward J. Wollack "Developing a new generation of integrated micro-spec far-infrared spectrometers for the experiment for cryogenic large-aperture intensity mapping (EXCLAIM)", Proc. SPIE 12180, Space Telescopes and Instrumentation 2022: Optical, Infrared, and Millimeter Wave, 121804Z (27 August 2022); https://doi.org/10.1117/12.2629502
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KEYWORDS
Spectrometers

Niobium

Silicon

Receivers

Antennas

Aluminum

Semiconducting wafers

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