Paper
12 December 2022 Digital metrology of polycrystalline networks of methyl acrylate layers
Author Affiliations +
Proceedings Volume 12476, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2022; 124760J (2022) https://doi.org/10.1117/12.2659303
Event: Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2022, 2022, Lublin, Poland
Abstract
This work is aimed at generalizing the methods of laser polarimetry in the case of partially depolarizing optically anisotropic methyl acrylate layers. A method of differential Mueller-matrix mapping is proposed and substantiated for reproducing the distributions of the parameters of linear and circular birefringence and dichroism of partially depolarizing methyl acrylate layers.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuriy Ushenko, Olexander Dubolazov, Yuriy Galushko, Mykhailo Gavrylyak, Pavlo Ryabiy, Olexander Arkhelyuk, Mykhailo Gorsky, Wenjun Yan, Viktoria Dumenko, Patryk Panas, and Daniyar Jarykbassov "Digital metrology of polycrystalline networks of methyl acrylate layers", Proc. SPIE 12476, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 2022, 124760J (12 December 2022); https://doi.org/10.1117/12.2659303
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KEYWORDS
Birefringence

Dichroic materials

Metrology

Polarization

Anisotropy

Polymers

Geometrical optics

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