Paper
23 January 2023 Research on the electrostatic discharge damage of CCD detectors
Author Affiliations +
Proceedings Volume 12556, AOPC 2022: Optoelectronics and Nanophotonics; 125561C (2023) https://doi.org/10.1117/12.2652049
Event: Applied Optics and Photonics China 2022 (AOPC2022), 2022, Beijing, China
Abstract
The electrostatic discharge (ESD) effect and damage mechanism of Charge Coupled Device (CCD) is investigated. Transmission line pulsing (TLP) tests have been experimented to identify the instantaneous I-V characteristics of CCD detectors under ESD stress. The TLP I-V curves of the ports with or without ESD protection show different characteristics, which indicate that the electrostatic discharge is a capacitor charging process for the ports without protection. The ports with smaller capacitance such as the transfer clock and readout clocks are the weakness against ESD events. The electrostatic damage site is further analyzed using emission microscopy (EMMI) and Focused Ion beam technology (FIB), revealing that the electrostatic damage mechanism of CCD.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
CanXiong Lai, ShaoHua Yang, ShuWang Li, YueBo Liu, WenYuan Liao, Yun Huang, GuoGuang Lu, and QingZhong Xiao "Research on the electrostatic discharge damage of CCD detectors", Proc. SPIE 12556, AOPC 2022: Optoelectronics and Nanophotonics, 125561C (23 January 2023); https://doi.org/10.1117/12.2652049
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KEYWORDS
Clocks

Charge-coupled devices

CCD image sensors

Sensors

Capacitors

Dielectrics

Capacitance

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