Paper
12 April 2023 Single-pixel imaging by using Zernike patterns illumination
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Proceedings Volume 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022); 125652F (2023) https://doi.org/10.1117/12.2662651
Event: Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 2022, Shanghai, China
Abstract
A novel single-pixel imaging (SPI) technique based on discrete orthogonal Zernike moments is proposed. In this technique, the target object is illuminated by two sets of Zernike basis patterns which satisfy the Zernike polynomials. The Zernike moments of object image are obtained by measuring the reflected light intensities with a single-pixel detector. And the object image is reconstructed by summing the product of Zernike polynomials and detected intensities iteratively. By theoretical and experimental demonstration, an image is successfully retrieved under compressive sampling. As for both gray and binary images with resolution of 128×128 pixels, the images reconstructed by Zernike patterns have better image quality compared with those reconstructed by Fourier patterns when sampling ratio is lower than 10%. This technique yields high efficiency and high imaging quality in single-pixel imaging system.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenchang Lai, Qi Meng, Guozhong Lei, Yan Wang, Wenda Cui, and Kai Han "Single-pixel imaging by using Zernike patterns illumination", Proc. SPIE 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 125652F (12 April 2023); https://doi.org/10.1117/12.2662651
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KEYWORDS
Zernike polynomials

Sensors

Modulation

Image quality

Imaging systems

Imaging arrays

Reconstruction algorithms

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