Extending the ablation imprints method of focal spot characterisation from X-ray to visible and near-infrared spectral range (Conference Presentation)

Šimon Jelínek; Tomáš Burian; Jan Dostál; Roman Dudžák; Věra Hájková; Libor Juha; Michal Krupka; Zuzana Kuglerová; Thomas Baumann; Simon Dold; Tommaso Mazza; Yevheniy Ovcharenko; Sergey Usenko; Michael Meyer; Jaromír Chalupský

doi:10.1117/12.2670501

6 June 2023 Extending the ablation imprints method of focal spot characterisation from X-ray to visible and near-infrared spectral range (Conference Presentation)

Šimon Jelínek, Tomáš Burian, Jan Dostál, Roman Dudžák, Věra Hájková, Libor Juha, Michal Krupka, Zuzana Kuglerová, Thomas Baumann, Simon Dold, Tommaso Mazza, Yevheniy Ovcharenko, Sergey Usenko, Michael Meyer, Jaromír Chalupský

Author Affiliations +

Proceedings Volume 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8); 125780B (2023) https://doi.org/10.1117/12.2670501
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

The ablation imprints method is a well-established approach to thoroughly characterising fluence distributions [J/cm2] of focused short-wavelength free-electron laser beams. For visible and near-infrared laser beams, fluence distribution of the focused beam can also be measured by other means, for example, by projecting a magnified image of the focal spot onto a camera. We studied the viability of the ablation imprints method in the visible and near-infrared spectral range and compared it to the above-mentioned conventional approach. Furthermore, we compared the effects of the X-ray, visible, and near-infrared radiation on the ablation damage. We characterised an X-ray astigmatic focused beam at the Small Quantum Systems instrument of the EuXFEL. At the Prague Asterix Laser System, we successfully characterised the focal spot at 438 nm. At 1315 nm, the ablation imprints method produced partially satisfactory results, and we compared these results with conventional methods. We conclude that the ablation imprints method can characterise focused laser beams in the visible and near-infrared spectral range.

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Šimon Jelínek, Tomáš Burian, Jan Dostál, Roman Dudžák, Věra Hájková, Libor Juha, Michal Krupka, Zuzana Kuglerová, Thomas Baumann, Simon Dold, Tommaso Mazza, Yevheniy Ovcharenko, Sergey Usenko, Michael Meyer, and Jaromír Chalupský "Extending the ablation imprints method of focal spot characterisation from X-ray to visible and near-infrared spectral range (Conference Presentation)", Proc. SPIE 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8), 125780B (6 June 2023); https://doi.org/10.1117/12.2670501

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KEYWORDS

Laser ablation

Visible radiation

X-rays

X-ray characterization

Ablation

Laser damage threshold

Quantum systems

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