Performance simulation of a diamond channel cut monochromator operating under high-heat load at the European X-Ray Free-Electron Laser Facility

K. R. Tasca; A. Madsen; I. Petrov; A. Rodriguez-Fernandez; R. Shayduk; M. Vannoni; A. Zozulya; L. Samoylova

doi:10.1117/12.2669178

9 June 2023 Performance simulation of a diamond channel cut monochromator operating under high-heat load at the European X-Ray Free-Electron Laser Facility

K. R. Tasca, A. Madsen, I. Petrov, A. Rodriguez-Fernandez, R. Shayduk, M. Vannoni, A. Zozulya, L. Samoylova

Author Affiliations +

Proceedings Volume 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; 125810L (2023) https://doi.org/10.1117/12.2669178
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

The European X-Ray Free Electron Laser (EuXFEL) is a unique facility that provides femtosecond x-ray pulses of high pulse energy at MHz repetition rate. However, the high peak power results in a high dynamical heat load in the optical components, like monochromators, which reduces the intensity of the transmitted pulses significantly as compared to the full capacity of the EuXFEL source. To address these challenges at the high photon energy instruments of EuXFEL, we propose a diamond channel cut monochromator as an alternative to the standard Si monochromators. Diamond has a lower absorption cross-section at high photon energies and a higher thermal conductivity compared to Si, making diamond a promising candidate for x-ray optics applications under high heat load conditions. Here, we present a finite element model (FEM) of the temperature increase in diamond and the resulting thermal expansion to estimate the changes in the diffraction profile and the expected monochromator transmission depending on the number of pulses.

Citation Download Citation

K. R. Tasca, A. Madsen, I. Petrov, A. Rodriguez-Fernandez, R. Shayduk, M. Vannoni, A. Zozulya, and L. Samoylova "Performance simulation of a diamond channel cut monochromator operating under high-heat load at the European X-Ray Free-Electron Laser Facility", Proc. SPIE 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, 125810L (9 June 2023); https://doi.org/10.1117/12.2669178

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available