Design, manufacturing, and characterization of x-ray optics for the cavity-based x-ray free-electron laser project

Peifan Liu; Paresh Pradhan; Xianbo Shi; Deming Shu; Keshab Kauchha; Zhi Qiao; Kenji Tamasaku; Taito Osaka; Diling Zhu; Takahiro Sato; James MacArthur; XianRong Huang; Lahsen Assoufid; Marion White; Kwang-Je Kim; Yuri Shvyd'ko

doi:10.1117/12.2677194

3 October 2023 Design, manufacturing, and characterization of x-ray optics for the cavity-based x-ray free-electron laser project

Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang-Je Kim, Yuri Shvyd'ko

Author Affiliations +

Proceedings Volume 12695, Advances in Metrology for X-Ray and EUV Optics X; 126950C (2023) https://doi.org/10.1117/12.2677194
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

Here, we report the design, manufacturing, and characterization of x-ray optical components for the cavity-based x-ray free-electron laser (CBXFEL) cavity, in the framework of the CBXFEL R&D collaborative project of Argonne National Laboratory, SLAC National Accelerator Laboratory, and SPring-8. The optical components include high-reflectivity diamond crystal mirrors, reflecting and output coupling diamond drumhead crystal with thin membranes, focusing beryllium refractive lenses, and channel-cut Si crystal monochromators. All the designed optical components have been fully characterized at the Advanced Photon Source to demonstrate their desired performance for the CBXFEL cavity.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang-Je Kim, and Yuri Shvyd'ko "Design, manufacturing, and characterization of x-ray optics for the cavity-based x-ray free-electron laser project", Proc. SPIE 12695, Advances in Metrology for X-Ray and EUV Optics X, 126950C (3 October 2023); https://doi.org/10.1117/12.2677194

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