Paper
16 June 2023 Research on high precision fiber optic platform system temperature compensation technology
Lei Wang, Wen Zhang, Tingjun Wang, Aiqi Liang, Tao Tao
Author Affiliations +
Proceedings Volume 12703, Sixth International Conference on Intelligent Computing, Communication, and Devices (ICCD 2023); 127031P (2023) https://doi.org/10.1117/12.2682889
Event: Sixth International Conference on Intelligent Computing, Communication, and Devices (ICCD 2023), 2023, Hong Kong, China
Abstract
In a high-precision fiber optic platform system, temperature changes will have a significant impact on the start-up speed and actual application accuracy. In order to effectively improve the navigation accuracy of the system, the article analyzes the temperature characteristics of the system-level calibration error parameters and establishes a temperature error model. Finally, a temperature compensation test and a platform model calibration test are designed to verify the compensation effect. The test results show that the established temperature error compensation model is accurate and effective. The stability of error parameters has increased by an order of magnitude. The method improves the performance of the fiber optic platform at the start-up stage, and has a small amount of calculation, which has high engineering application value.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Wang, Wen Zhang, Tingjun Wang, Aiqi Liang, and Tao Tao "Research on high precision fiber optic platform system temperature compensation technology", Proc. SPIE 12703, Sixth International Conference on Intelligent Computing, Communication, and Devices (ICCD 2023), 127031P (16 June 2023); https://doi.org/10.1117/12.2682889
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Accelerometers

Gyroscopes

Optical fibers

Fiber optic gyroscopes

Modeling

Temperature metrology

Back to Top