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12 March 2024 Nondestructive, in situ infrared imaging of line defect growth in high-power diode laser cavities
Luyang Wang, Salmaan H. Baxamusa, Robert J. Deri, Elaine McVay, William E. Fenwick, Jack Kotovsky, Mark Crowley, Jiyon Song, Gerald Thaler, Adam Dusty, Christopher Schuck, Kevin P. Pipe
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Proceedings Volume 12867, High-Power Diode Laser Technology XXII; 128670G (2024) https://doi.org/10.1117/12.3001885
Event: SPIE LASE, 2024, San Francisco, California, United States
Abstract
Using a high sensitivity infrared camera, we image the optical cavity of an operating high-power diode laser through a window etched in the substrate and observe weak IR emission from the waveguide core region. The IR intensity maps show dark spots in the cavity that subsequently grow into line defects (all oriented in the same direction) as the laser ages. This technique holds promise as a nondestructive, in situ approach to study the formation and evolution of defects in an operating device. We also use CCD-based thermoreflectance to generate high-resolution facet temperature profiles of the same lasers during aging, with the results suggesting that the slow degradation of optical power that occurs prior to laser failure relates more to cavity defect formation than facet defect (hotspot) formation.
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(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Luyang Wang, Salmaan H. Baxamusa, Robert J. Deri, Elaine McVay, William E. Fenwick, Jack Kotovsky, Mark Crowley, Jiyon Song, Gerald Thaler, Adam Dusty, Christopher Schuck, and Kevin P. Pipe "Nondestructive, in situ infrared imaging of line defect growth in high-power diode laser cavities", Proc. SPIE 12867, High-Power Diode Laser Technology XXII, 128670G (12 March 2024); https://doi.org/10.1117/12.3001885
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KEYWORDS
Infrared imaging
Semiconductor lasers
Nondestructive evaluation
High power lasers
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