Characterization of filtered FLIR systems designed for chemical vapor detection and mapping

Lewis W. Carr; Leland Fletcher; Peter L. Holland; Joseph Leonelli; David McPherrin; Mark L.G. Althouse

doi:10.1117/12.21788

1 October 1990 Characterization of filtered FLIR systems designed for chemical vapor detection and mapping

Lewis W. Carr, Leland Fletcher, Peter L. Holland, Joseph Leonelli, David McPherrin, Mark L.G. Althouse

Proceedings Volume 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing; (1990) https://doi.org/10.1117/12.21788
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

This paper describes the test and analysis of spectrally modified thermal-imaging systems designed to detect chemical vapor clouds.

Citation Download Citation

Lewis W. Carr, Leland Fletcher, Peter L. Holland, Joseph Leonelli, David McPherrin, and Mark L.G. Althouse "Characterization of filtered FLIR systems designed for chemical vapor detection and mapping", Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); https://doi.org/10.1117/12.21788

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