Modeling of internal contaminant deposition on a cold instrument sensor

Jack B. Barengoltz; Jerry M. Millard; Teresa K. Jenkins; Daniel M. Taylor

doi:10.1117/12.22615

1 November 1990 Modeling of internal contaminant deposition on a cold instrument sensor

Jack B. Barengoltz, Jerry M. Millard, Teresa K. Jenkins, Daniel M. Taylor

Proceedings Volume 1329, Optical System Contamination: Effects, Measurement, Control II; (1990) https://doi.org/10.1117/12.22615
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A model is developed to predict the deposition of contaminants on the CCD sensors of the Wide Field Planetary Camera to determine expected performance parameters. Contaminant deposition due to internal instrument sources is considered as is the mechanism of transport to the CCDs themselves. The Contamination Analysis Program (CAP) model considers deposition and reemission kinetics, nodal containment sources, and internodal shape factors related to line-of-sight transport. Indirect transport is also accounted for in the CAP model by considering the effect of diffuse reflection at internodal exchanges. The effective total transport factors for each node-to-node exchange is precalculated to reduce the effective number of nodes and reducing run time of the CAP program. The method is applied to four distinct conditions and is found to be suitable for the analysis of internal self-contamination. Cold traps, venting, and vacuumlike design are factors which are found to be important for cold-sensitive sensors.

Citation Download Citation

Jack B. Barengoltz, Jerry M. Millard, Teresa K. Jenkins, and Daniel M. Taylor "Modeling of internal contaminant deposition on a cold instrument sensor", Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); https://doi.org/10.1117/12.22615

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