Comparison of microdeformation in I-70, O-50 and a new instrument grade of beryllium (I-250)

James M. Marder

doi:10.1117/12.22872

1 November 1990 Comparison of microdeformation in I-70, O-50 and a new instrument grade of beryllium (I-250)

James M. Marder

Proceedings Volume 1335, Dimensional Stability; (1990) https://doi.org/10.1117/12.22872
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The microdeformation characteristics of a new instrunent grade of beryllium 1-250 are presented and compared to previously available conunercial grades. The importance of iuicroyield strength to mirror stability under mechanical and inertial loads as well as under temperature excursions is discussed and related to the HCP crystal structure. It is concluded that 1-250 may provide significantly improved dimensional stability over 1-70 or 0-50. 1.

Citation Download Citation

James M. Marder "Comparison of microdeformation in I-70, O-50 and a new instrument grade of beryllium (I-250)", Proc. SPIE 1335, Dimensional Stability, (1 November 1990); https://doi.org/10.1117/12.22872

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