Feasibility study on measuring jitter of moving plane with dial indicator

Zeshun Wang; Xiaofeng Chen; Lixin Wang

doi:10.1117/12.3055353

12 December 2024 Feasibility study on measuring jitter of moving plane with dial indicator

Zeshun Wang, Xiaofeng Chen, Lixin Wang

Author Affiliations +

Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 134391S (2024) https://doi.org/10.1117/12.3055353
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China

Abstract

In the process of installation and debugging in the industrial field, it is worth exploring whether the micrometer can be used to replace the high-precision sensors and supporting equipment to measure the amount of jitter of the motion plane. By splitting the micrometer, measuring, simplifying, building a simulation in ADAMS, designing a test scheme according to the scene of LCD panel inspection, and carrying out experimental research and data analysis and processing at different speeds, the results show that the micrometer is capable of measuring the plane jitter of LCD panel production equipment within a certain moving speed. This study provides a feasible basis for the use of micrometers for measurements under mobile conditions, which can significantly reduce the cost of enterprises.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zeshun Wang, Xiaofeng Chen, and Lixin Wang "Feasibility study on measuring jitter of moving plane with dial indicator", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 134391S (12 December 2024); https://doi.org/10.1117/12.3055353

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