Paper
1 February 1992 Nonexponential transition rates from deep levels
Andrew K. Jonscher
Author Affiliations +
Proceedings Volume 1523, Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits; (1992) https://doi.org/10.1117/12.56973
Event: Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits, 1992, Madras, India
Abstract
No abstract available.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew K. Jonscher "Nonexponential transition rates from deep levels", Proc. SPIE 1523, Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits, (1 February 1992); https://doi.org/10.1117/12.56973
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KEYWORDS
Electrons

Silicon

Luminescence

Semiconductors

Capacitance

Measurement devices

Time metrology

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