Paper
1 December 1991 Determination of thermal stresses in a bimaterial specimen by moiré interferometry
Yilan Kang, Youquan Jia, Ji Du
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Abstract
The thermal deformation and stresses of a bimaterial specimen were determined by high sensitive moiré interferometry. A thermal replicate method was developed in which the thermally deformed specimen grating was replicated to a non-thermal expansion glass plate at elevated temperature and viewed at a moiré intermerometer after it was cooled. The carrier fringe technique was used to separate the free thermal expansion and the thermal stress-induced deformation. Based on the test results the thermal strains and stresses around the interface and the stress concentration at the inner corner of the bimaterial specimen were discussed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yilan Kang, Youquan Jia, and Ji Du "Determination of thermal stresses in a bimaterial specimen by moiré interferometry", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57435
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Cited by 1 scholarly publication.
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KEYWORDS
Deflectometry

Moire patterns

Interfaces

Epoxies

Mechanics

Fringe analysis

Glasses

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