Paper
1 October 1991 Far-infrared ellipsometry of converged beam, theory and experiment
A. B. Sushkov
Author Affiliations +
Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 15764A (1991) https://doi.org/10.1117/12.2297867
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
Ellipsometry is a well known technique of measurement of the optical constants of different substances. To determine the optical constants of small samples in FIR someone should focus irradiation on the sample surface by means of lens or mirror to avoid diffraction effects and to use all energy of the beam. So the problem of converged beam ellipsometry arises. This decision is valid in approximation of parabolic equation or Fresnel integral.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. B. Sushkov "Far-infrared ellipsometry of converged beam, theory and experiment", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15764A (1 October 1991); https://doi.org/10.1117/12.2297867
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KEYWORDS
Ellipsometry

Fourier transforms

Refractive index

Diffraction

Sensors

Signal detection

Mirrors

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