Paper
14 August 1992 Remote Raman analysis for process-monitoring applications
Francis J. Purcell, Roy E. Grayzel, Fran Adar
Author Affiliations +
Proceedings Volume 1681, Optically Based Methods for Process Analysis; (1992) https://doi.org/10.1117/12.137731
Event: SPIE's 1992 Symposium on Process Control and Monitoring, 1992, Somerset, NJ, United States
Abstract
Recent developments in Raman instrumentation have produced sensitive compact rugged systems capable of monitoring industrial processes in-situ using fiber optic probes. Raman spectroscopy's ability to give definitive molecular information in aqueous and organic matrices makes it exceedingly powerful in monitoring and troubleshooting chemical processing.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francis J. Purcell, Roy E. Grayzel, and Fran Adar "Remote Raman analysis for process-monitoring applications", Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); https://doi.org/10.1117/12.137731
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Cited by 3 scholarly publications.
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KEYWORDS
Raman spectroscopy

Spectroscopy

Statistical analysis

Chemical analysis

Fiber optics

Charge-coupled devices

Infrared spectroscopy

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