Device working on the light principle for surface-roughness measurement

Josef Mandak

doi:10.1117/12.139239

15 December 1992 Device working on the light principle for surface-roughness measurement

Josef Mandak

Proceedings Volume 1776, Interferometry: Surface Characterization and Testing; (1992) https://doi.org/10.1117/12.139239
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The paper describes the present design of contact profile meters for evaluation of topography- roughness of machine part surfaces in the manufacturing processes, including automated ones. Considerable attention is paid to the surfaces with a difficult or no access for the contact profilometer. In order to scan these surfaces of machine parts an experimental measuring device of module conception has been designed that works on the light principle and utilizes elements of laser technique. Interesting original experimental results are given that have been obtained by both, contact and light procedure. They explain in greater detail the given problems that are attractive especially from the standpoint of perspective automated production.

Citation Download Citation

Josef Mandak "Device working on the light principle for surface-roughness measurement", Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); https://doi.org/10.1117/12.139239

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