Development and prequalification of a medium-accuracy wide-field pattern recognition starsensor

Peter Verhoeff; Kees de Boom; H. Meier; G. Andre

doi:10.1117/12.156606

1 October 1993 Development and prequalification of a medium-accuracy wide-field pattern recognition starsensor

Peter Verhoeff, Kees de Boom, H. Meier, G. Andre

Proceedings Volume 1950, Acquisition, Tracking, and Pointing VII; (1993) https://doi.org/10.1117/12.156606
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

A development of a medium accuracy, CCD based starsensor, intended for use on the new generation of communication satellites is in progress. The sensor aims at an accuracy of 0.06 degree(s) in a FOV of 30 degree(s) X 40 degree(s). The sensor is designed to detect stars with a brightness of m_via <EQ + 2.5 during its whole lifetime of at least 10 years. A breadboard of this starsensor, called Pattern Recognition System (PRS) was built and verified and the manufacturing of an EQM is ongoing now. Intended to be versatile in applications for telecommunication and other missions, a unit is developed which is adaptive and has low recurring cost. The PRS concept is based on new MPP CCD technology. This technology brings passive thermal control without Peltier elements within reach. The electronics accommodated inside the PRS sensorheads is miniaturized by large scale integration by using a Field Programmable Gate Array (FPGA) and Surface Mount Technology (SMT). For cost reasons no microprocessor was implemented. This paper describes the main design features of the PRS, the selection and testing of appropriate CCD, performance characteristics of the system and test results obtained from the PRS breadboard system.

Citation Download Citation

Peter Verhoeff, Kees de Boom, H. Meier, and G. Andre "Development and prequalification of a medium-accuracy wide-field pattern recognition starsensor", Proc. SPIE 1950, Acquisition, Tracking, and Pointing VII, (1 October 1993); https://doi.org/10.1117/12.156606

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available