Thin-Film Scintillators For Extended Ultraviolet (UV) Response Silicon Detectors

Walter Viehmann

doi:10.1117/12.957960

15 November 1979 Thin-Film Scintillators For Extended Ultraviolet (UV) Response Silicon Detectors

Walter Viehmann

Proceedings Volume 0196, Measurements of Optical Radiations; (1979) https://doi.org/10.1117/12.957960
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

The preparation and radiometric properties of silicon detectors coated with fluorescent thin films are described. The films are deposited from solutions of clear plastics, such as acrylic resins, polyvinyl toluene or polystyrene, and of organic laser dyes in a common solvent. They are optically clear, mechanically and chemically stable, yet easily applied and removed. Multiple doped films of a few μm thickness exhibit broadband absorption from < 250 nm to ~ 450 nm and narrow band emissions with peaks ranging from 380 nm to 600 nm. Internal quantum efficiencies are close to 100 percent and fluorescence decay times are in the nanosecond range. When deposited on optically denser media, a large fraction of the fluorescent emission is trapped in the substrate. Silicon photodiodes coated with multiple doped films exhibit high external quantum efficiencies and virtually flat photon response in the near uv.

Citation Download Citation

Walter Viehmann "Thin-Film Scintillators For Extended Ultraviolet (UV) Response Silicon Detectors", Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); https://doi.org/10.1117/12.957960

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