Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption

Pierre V. Villeneuve; Curtis H. Stern

doi:10.1117/12.154881

15 September 1993 Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption

Pierre V. Villeneuve, Curtis H. Stern

Author Affiliations +

Proceedings Volume 1968, Atmospheric Propagation and Remote Sensing II; (1993) https://doi.org/10.1117/12.154881
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

The goal of this research was to map the regimes of validity of the weak-line and strong-line limits as a function of temperature, pressure, and path length for the 2.7 micrometers and 6.3 micrometers H₂O absorption bands. These calculations were done using an updated version of the NASA band model. A parametric study was performed where the error in assuming the validity of the two limits was calculated as a function of the physical parameters temperature, pressure, and path length. Results were generated in the form of spectral plots of the error and as band-integrated error presented in contour plots as a function of temperature and path length. Results indicate that for both bands, the weak-line error is localized in regions of intermediate temperatures and pressures at all path lengths. The strong-line limit error shows a linear increasing trend with pressure at short path lengths, while varying as a saddle-shaped function with respect to temperature and pressure at longer path lengths.

Citation Download Citation

Pierre V. Villeneuve and Curtis H. Stern "Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption", Proc. SPIE 1968, Atmospheric Propagation and Remote Sensing II, (15 September 1993); https://doi.org/10.1117/12.154881

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