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The holographic method to control transparent plate and film thickness variations by heterodyne measurement of the phase of transversed coherent light is theoretically and experimentally analyzed. It provides very high accuracy (about 1 nm) of the thickness variations measurements in visible range.
E. I. Krupitsky,S. V. Morosov, andTatyana N. Sergeenko
"Heterodyne holographic method of data acquisition on thickness variation of transparent plates and films", Proc. SPIE 1978, Coherent Measuring and Data Processing Methods and Devices, (3 September 1993); https://doi.org/10.1117/12.155040
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E. I. Krupitsky, S. V. Morosov, Tatyana N. Sergeenko, "Heterodyne holographic method of data acquisition on thickness variation of transparent plates and films," Proc. SPIE 1978, Coherent Measuring and Data Processing Methods and Devices, (3 September 1993); https://doi.org/10.1117/12.155040