Development of a hard x-ray imaging polarimeter

Robert A. Austin; Takahisa Minamitani; Brian D. Ramsey

doi:10.1117/12.168571

15 February 1994 Development of a hard x-ray imaging polarimeter

Robert A. Austin, Takahisa Minamitani, Brian D. Ramsey

Proceedings Volume 2010, X-Ray and Ultraviolet Polarimetry; (1994) https://doi.org/10.1117/12.168571
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

An optical imaging chamber can be used to detect x-rays by imaging the tracks of photoelectrons ejected when the x-rays are absorbed in the detector volume. These tracks contain information about the location of the x-ray interaction point and its polarization. In the lab, we have obtained a modulation factor of 30% for 60 keV polarized x-rays. Here we discuss preliminary work done towards building a large area hard x-ray imaging polarimeter which will be able to measure x-ray polarizations from bright cosmic x-ray sources at energies between 40 keV and 100 keV.

Citation Download Citation

Robert A. Austin, Takahisa Minamitani, and Brian D. Ramsey "Development of a hard x-ray imaging polarimeter", Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); https://doi.org/10.1117/12.168571

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