Two- and three-dimensional laser scanners for fast dimensional measurements and inspection

Willem D. van Amstel; Ronald J. Asjes; Peter F.A. van de Goor; Piet Merkelbach

doi:10.1117/12.168057

1 February 1993 Two- and three-dimensional laser scanners for fast dimensional measurements and inspection

Willem D. van Amstel, Ronald J. Asjes, Peter F.A. van de Goor, Piet Merkelbach

Proceedings Volume 2088, Laser Dimensional Metrology: Recent Advances for Industrial Application; (1993) https://doi.org/10.1117/12.168057
Event: Laser Dimensional Metrology: Recent Advances for Industrial Application, 1993, Brighton, United Kingdom

Abstract

A family of high performance industrial laser scanners has been developed at Philips, based on a unique, reflective, field flattening system as an alterative for f-(Theta) scan lenses that are usually applied in laser scanners. This novel scan approach enables pure telecentric and flat field scanning of wide formats at very high resolution and speed. The attractive features of this particular scan concept are demonstrated by two different 2-D industrial inspection problems that have been solved at Philips during the last ten years.

Citation Download Citation

Willem D. van Amstel, Ronald J. Asjes, Peter F.A. van de Goor, and Piet Merkelbach "Two- and three-dimensional laser scanners for fast dimensional measurements and inspection", Proc. SPIE 2088, Laser Dimensional Metrology: Recent Advances for Industrial Application, (1 February 1993); https://doi.org/10.1117/12.168057

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