Phase analysis and its application in step-scan FTIR photoacoustic depth profiling

Richard Alan Palmer; Eric Yinghu Jiang; James L. Chao

doi:10.1117/12.166797

31 January 1994 Phase analysis and its application in step-scan FTIR photoacoustic depth profiling

Richard Alan Palmer, Eric Yinghu Jiang, James L. Chao

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166797
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

A new type of step-scan FT-IR spectrometer that allows multiple-frequency phase modulation or sample modulation is reported. Multiplexed photoacoustic and rheo-optical modulation spectra are also reported.

Citation Download Citation

Richard Alan Palmer, Eric Yinghu Jiang, and James L. Chao "Phase analysis and its application in step-scan FTIR photoacoustic depth profiling", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166797

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