Paper
22 September 1993 Grating quadrature fringe subdivision with submicron accuracy and its application in CMM
Rensheng Che, Li-Yan Chen, Cheng-Jun Chen, Qingcheng Huang
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156503
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
The significant resolution and accuracy of CMM ( Coordinat Measuring Machine ) using grating quadrature fringe detection are often limited not only by the CMM itself but also by the grating displasment measuring system. There are four errors: amplitude waver unequal amplitude in the two channels quadrature phase shift error and zero offsets. This paper describes a new method for picking up correcting the quadrature errors and subdividing -- method of composite compensating subdivision using microcomputer. An example demonstrated the significant improving of the precision of CMM and the reducing the needs of fix and adjustment of grading pair is given.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rensheng Che, Li-Yan Chen, Cheng-Jun Chen, and Qingcheng Huang "Grating quadrature fringe subdivision with submicron accuracy and its application in CMM", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156503
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KEYWORDS
Moire patterns

Phase shifts

Inspection

Signal processing

Amplitude modulation

Composites

Lithium

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