Paper
22 September 1993 Microdisplacement measurement in high-accuracy moving stage by strain gauges
Pengsheng Li, Hainan Cai
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156308
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
A noncontact displacement measuring apparatus similar in mechanism and electronics to the parallel bending beam weight scale has been made experimentally. The apparatus has four parallel bending beams as elastic elements that are also parts of the moving stage. When the moving stage is pushed up by a piezoelectric actuator there exists strain and deflection in the bending beams. Eight strain gages that are employed in a bridge configuration are placed on the regions of compression and tension of the beams. Thus the micro-displacement of the moving stage that is proportional to the output of the bridge can be measured.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pengsheng Li and Hainan Cai "Microdisplacement measurement in high-accuracy moving stage by strain gauges", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156308
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KEYWORDS
Sensors

Wheatstone bridges

Bridges

Actuators

Calibration

Resistance

Lithium

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