Re-emitted positron spectroscopy as a structural probe of metal overlayer systems: Pd/Cu(100)

Geoffrey W. Anderson; Kjeld O. Jensen; Peter R. Norton; Peter J. Schultz

doi:10.1117/12.175780

11 May 1994 Use of re-emitted positron spectroscopy as a structural probe of metal overlayer systems: Pd/Cu(100)

Geoffrey W. Anderson, Kjeld O. Jensen, Peter R. Norton, Peter J. Schultz

Proceedings Volume 2140, Epitaxial Growth Processes; (1994) https://doi.org/10.1117/12.175780
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

The growth and annealing properties of Pd overlayers on Cu(100) have been investigated using re-emitted positron spectroscopy, low energy electron diffraction, and Rutherford backscattering spectroscopy. Two changes in the growth mode of the Pd overlayers have been observed at approximately 0.5 and approximately 1 monolayer Pd coverage. These changes correspond to the completion of the first and second alloy layers, the latter also being associated with the beginning of the growth of bulk Pd. The bulk Pd film does not grow in an epitaxial manner and was found to contain approximately 1% vacancy defects. For 0.5 monolayer Pd/Cu(100) overlayers annealing at 353 K has been observed to result in the loss of Pd from the surface to the bulk and the removal of defects associated with the overlayer.

Citation Download Citation

Geoffrey W. Anderson, Kjeld O. Jensen, Peter R. Norton, and Peter J. Schultz "Use of re-emitted positron spectroscopy as a structural probe of metal overlayer systems: Pd/Cu(100)", Proc. SPIE 2140, Epitaxial Growth Processes, (11 May 1994); https://doi.org/10.1117/12.175780

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