Paper
2 July 1994 Comparison of Josephson radiation properties of different YBa2Cu3O7 thin film junctions
Gerhard Kunkel, M. Bode, F. Wang, M. I. Faley, Michael Siegel, Willi Zander, Juergen Schubert, Ulrich Poppe, Alex I. Braginski
Author Affiliations +
Proceedings Volume 2160, Superconductive Devices and Circuits; (1994) https://doi.org/10.1117/12.181011
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
Abstract
We have investigated the Josephson radiation from different types of YBa2Cu3O7 (YBCO) thin film junctions: step-edge (SEJ), biepitaxial, and superconductor-normal conductor- superconductor (SNS) with N=Au and PrBa2Cu3O7. The radiation was detected using a nonresonant radiometer system with a receiving frequency of 11-12 GHz. The current-voltage characteristics were measured simultaneously with the radiation spectra in the temperature range from 4.2 to 90 K. All junctions exhibited a large emission peak at a voltage which was related to the frequency through the second Josephson relation. Typically, for high temperatures, and, therefore, small critical currents, the experimental data of the radiation linewidth agreed well with the theoretical predictions of the RSJ model. At lower temperatures the experimental linewidths deviated from the theoretical values due to additional noise sources in the junctions. Some of the SEJs showed a nonmonotonic dependence of the linewidth on temperature. Such SEJ data will be discussed in terms of a model which treats the SEJ as an interferometer consisting of a parallel array of Josephson junctions.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerhard Kunkel, M. Bode, F. Wang, M. I. Faley, Michael Siegel, Willi Zander, Juergen Schubert, Ulrich Poppe, and Alex I. Braginski "Comparison of Josephson radiation properties of different YBa2Cu3O7 thin film junctions", Proc. SPIE 2160, Superconductive Devices and Circuits, (2 July 1994); https://doi.org/10.1117/12.181011
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KEYWORDS
Data modeling

Thin films

Resistance

Temperature metrology

Radiometry

Interferometers

Sputter deposition

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