Paper
1 May 1994 High-frame-rate, motion-compensated 25.4 megapixel image sensor
Stacy R. Kamasz, Michael G. Farrier, Shing-Fat Fred Ma, Robert W. Sabila, Savvas G. Chamberlain
Author Affiliations +
Proceedings Volume 2172, Charge-Coupled Devices and Solid State Optical Sensors IV; (1994) https://doi.org/10.1117/12.172766
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
The applicability of large-area full-frame CCD image sensor technology to large optical format aerial reconnaissance applications has been recently demonstrated. The requirements of low-contrast, high-resolution imaging at high frame rates have generated the need for a manufacturable, multitap, small-pitch, wafer-scale CCD image sensor technology. The added requirement of incorporation of electronic motion compensation at the focal plane has generated the need for multisegmented full-frame area array architectures. Characterization results from the newly developed 5040 X 5040 element, eight-tap, full-frame image sensor with multisegmentation for electronic motion compensation are discussed. Experimental determination of resistive-capacitive time constants for metal strapped vertical clock busses on wafer-scale sensors is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stacy R. Kamasz, Michael G. Farrier, Shing-Fat Fred Ma, Robert W. Sabila, and Savvas G. Chamberlain "High-frame-rate, motion-compensated 25.4 megapixel image sensor", Proc. SPIE 2172, Charge-Coupled Devices and Solid State Optical Sensors IV, (1 May 1994); https://doi.org/10.1117/12.172766
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Cited by 3 scholarly publications.
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KEYWORDS
Clocks

Metals

Sensors

CCD image sensors

Image sensors

Resistance

Capacitance

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