Detailed measurements and shaping of gate profiles for microchannel-plate-based x-ray framing cameras

Otto L. Landen; Amber C. Abare; Bruce A. Hammel; Perry M. Bell; David K. Bradley

doi:10.1117/12.189033

14 October 1994 Detailed measurements and shaping of gate profiles for microchannel-plate-based x-ray framing cameras

Otto L. Landen, Amber C. Abare, Bruce A. Hammel, Perry M. Bell, David K. Bradley

Proceedings Volume 2273, Ultrahigh- and High-Speed Photography, Videography, and Photonics '94; (1994) https://doi.org/10.1117/12.189033
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Large dynamic range (> 1000) measurements of gain profiles for gated microchannel plates are presented. Temporal profiles are reconstructed for any point on the microstrip transmission line from data acquired over many shots with variable delay. No evidence for significant pulse distortion by voltage reflections at the ends of the microstrip is observed. The measured profiles compare well to predictions by a time-dependent discrete dynode model down to the 1% level. The calculations do overestimate the contrast further into the temporal wings. The role of electron transit time dispersion in limiting the minimum achievable gate duration is then investigated by using variable duration flattop gating pulses. A minimum gate duration of 50 ps is achieved with flattop gating, consistent with a fractional transit time spread of approximately equals 15%.

Citation Download Citation

Otto L. Landen, Amber C. Abare, Bruce A. Hammel, Perry M. Bell, and David K. Bradley "Detailed measurements and shaping of gate profiles for microchannel-plate-based x-ray framing cameras", Proc. SPIE 2273, Ultrahigh- and High-Speed Photography, Videography, and Photonics '94, (14 October 1994); https://doi.org/10.1117/12.189033

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