Efficient morphological segmentation for significantly overlapped particles

Yim-Kul Lee; Jung-Hee Kim

doi:10.1117/12.205237

28 March 1995 Efficient morphological segmentation for significantly overlapped particles

Yim-Kul Lee, Jung-Hee Kim

Proceedings Volume 2424, Nonlinear Image Processing VI; (1995) https://doi.org/10.1117/12.205237
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

An efficient morphological method, based on watershed concept, is presented for the segmentation of overlapped particles with similar sizes. The method described first calculates the distance functions of particles in an image and then compares the boundary lengths of segmented regions with those of their minima to discriminate between desirable and undesirable segments. A post-processing is followed to merge the undesirable segments into the desirable neighboring segments, computing the new distance functions of the former segments. Experimental results are given with circular particles significantly overlapped along with comparisons.

Citation Download Citation

Yim-Kul Lee and Jung-Hee Kim "Efficient morphological segmentation for significantly overlapped particles", Proc. SPIE 2424, Nonlinear Image Processing VI, (28 March 1995); https://doi.org/10.1117/12.205237

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