Paper
19 May 1995 Performance of IBM's EL-4 e-beam lithography system
James D. Rockrohr, R. Butsch, W. A. Enichen, Michael S. Gordon, Timothy R. Groves, John G. Hartley, Hans C. Pfeiffer
Author Affiliations +
Abstract
IBM's latest electron beam mask maker, EL-4, is online at IBM's Advanced Mask Facility (AMF) in Essex Junction, Vermont. The EL-4 system is a 75KV shaped beam lithography system utilizing a Variable Axis Immersion Lens (VAIL) designed to produce 1X or NX masks for 0.25 micrometers lithography ground rules, extendable to 0.13 micrometers . It is currently producing NIST-style X-ray membrane masks with pattern sizes over 30 X 30 mm2. This paper will give a brief description of the EL-4 tool and its operating features, specific measures used to enhance tool stability and accuracy, and measurement data from masks recently produced on the tool.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James D. Rockrohr, R. Butsch, W. A. Enichen, Michael S. Gordon, Timothy R. Groves, John G. Hartley, and Hans C. Pfeiffer "Performance of IBM's EL-4 e-beam lithography system", Proc. SPIE 2437, Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing V, (19 May 1995); https://doi.org/10.1117/12.209156
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Cited by 7 scholarly publications.
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KEYWORDS
Photomasks

Calibration

Control systems

Electroluminescence

Magnetism

Analog electronics

Electron beams

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