Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor

Hiromi Azuma; Tsutomu Endoh; Kazuo Konuma; Yoshitaka Asano; Takanori Tanaka; Nobukazu Teranishi

doi:10.1117/12.210546

30 May 1995 Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor

Hiromi Azuma, Tsutomu Endoh, Kazuo Konuma, Yoshitaka Asano, Takanori Tanaka, Nobukazu Teranishi

Author Affiliations +

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210546
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

A new analytical method to estimate temperature and emissivity for infrared measurements is described. There are four steps in the method. First, in calculating the output voltage, the dependence of temperature and emissivity of the object was evaluated. The result was the output voltage increased in proportion to the second power of the object temperature and the dependence of the emissivity was linear for the 250 K to 400 K temperature range. Second, in the fitting of these polynomial equations, the orders of six coefficients were also evaluated. Third, in measuring the output voltage of the standard imaging area, the unit transfer coefficient from digital unit (LSB) to voltage (V) was computed. Finally, an inversion problem for estimating temperature and emissivity of the object was proposed. We have developed a new kind of 3 approximately 5 micrometers band Schottky-barrier infrared CCD image sensor, which we call SCAT648, to verify the validity of the estimating method. The SCAT648 image sensor is composed of the different types of pixels. These pixels have different spectral responsivities and capabilities of measuring target temperature and target emissivity. Four standard temperature-controlled samples were imaged with the newly developed SCAT648 camera system. We estimate the error of the temperature and emissivity measurements to be a low +/- 0.5 K and +/- 5%, respectively.

Citation Download Citation

Hiromi Azuma, Tsutomu Endoh, Kazuo Konuma, Yoshitaka Asano, Takanori Tanaka, and Nobukazu Teranishi "Estimating temperature and emissivity for infrared measurements using a PtSi Schottky-barrier infrared CCD image sensor", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210546

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
7 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

CCD image sensors

Temperature metrology

Infrared radiation

Sensors

Infrared imaging

Imaging systems

Thermography

Show All Keywords

Keywords/Phrases

Search In:

Publication Years