New method for nonuniformity correction of solid state image sensor

Xianghui Yuan; Wenlue Wan; Mingfu Zhao

doi:10.1117/12.217397

22 August 1995 New method for nonuniformity correction of solid state image sensor

Xianghui Yuan, Wenlue Wan, Mingfu Zhao

Proceedings Volume 2564, Applications of Digital Image Processing XVIII; (1995) https://doi.org/10.1117/12.217397
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

The importance of the nonuniformity (NU) correction of solid state image sensor (IS) lies on enhancing the signal-to-noise ration, especially in low-contrast signal detection. There are various methods for NU correction of IS. But some of the traditional methods are complexed in circuit, and difficult to adjust; some are slow at correction rate, and can not satisfy the real time correction requirement. In this paper, a new method for NU correction is introduced, in which the nonuniformity is corrected by using the memory's function conversion efficiency. The chief advantages of this method are: the correction circuit is simpler and easy to adjust; the convertion rate is relatively high (> equals 5MHz); the correction range is wide.

Citation Download Citation

Xianghui Yuan, Wenlue Wan, and Mingfu Zhao "New method for nonuniformity correction of solid state image sensor", Proc. SPIE 2564, Applications of Digital Image Processing XVIII, (22 August 1995); https://doi.org/10.1117/12.217397

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