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Results of an analysis of surface profile measurements by J. Bennett on a set of very smooth flat surfaces is presented. Visible scattering profiles are predicted and compared with measured scatter profiles. The predicted scatter profiles are integrated for compari-son with total integrated scatter measurements (TIS). Using the model analysis at X-ray wavelengths illustrates the impact of various surface profiles on X-ray imaging.
R J Noll andP Glenn
"Scattering From Surface Roughness�Implications On X-Ray Imaging", Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); https://doi.org/10.1117/12.959618
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R J Noll, P Glenn, "Scattering From Surface Roughness�Implications On X-Ray Imaging," Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); https://doi.org/10.1117/12.959618