Fault-tolerant byte organized semiconductor memory subsystems based on error-correcting codes

Bingrong Wang

doi:10.1117/12.217513

28 August 1995 Fault-tolerant byte-organized semiconductor memory subsystems based on error-correcting codes

Bingrong Wang

Proceedings Volume 2620, International Conference on Intelligent Manufacturing; (1995) https://doi.org/10.1117/12.217513
Event: International Conference on Intelligent Manufacturing, 1995, Wuhan, China

Abstract

An effective means of designing a fault-tolerant semiconductor memory subsystem using error-correcting codes is obtained. One such code is the 1-UbEC code, the other is the 2B- UbEC code which is used to correct two unidirectional burst bytes errors. Finally, as an example of the application, the on-chip realization of 2B-UbEC code is discussed; it shows that the application of the error correcting codes for fault-tolerance is effective and convenient.

Citation Download Citation

Bingrong Wang "Fault-tolerant byte-organized semiconductor memory subsystems based on error-correcting codes", Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); https://doi.org/10.1117/12.217513

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