Noise measurement technique for document scanners

Xiaofan Feng; John T. Newell; Roger Triplett

doi:10.1117/12.236113

25 March 1996 Noise measurement technique for document scanners

Xiaofan Feng, John T. Newell, Roger Triplett

Proceedings Volume 2654, Solid State Sensor Arrays and CCD Cameras; (1996) https://doi.org/10.1117/12.236113
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

Scanner noise is one of the fundamental parameters of image quality. In this paper, we present an algorithm developed to derive the noise of a scanner using the 2D Wiener spectra of the test pattern and the scanner's MTF. The Wiener spectra of the test pattern was measured and its contribution to the measured RMS noise was estimated by integrating the volume under the product of the test pattern Wiener spectra and the scanner's MTF. The test pattern contribution was then removed from the measured noise. The derived noise agrees very well with the noise model for both drum scanner and CCD scanners. The structured 1D noise is also of interest especially when evaluating CCD scanner systems. A method was described to accurately determine 1D structured noise by averaging over fast scan and slow scan directions. Finally an experiment was conducted to verify the noise measurement technique. The true noise of a drum scanner was measured at its analog output terminal, and was compared to the noise estimated with the proposed new noise metric. The agreement between hardware measured noise and the estimated noise is very good with RMS error of less than 0.001 in reflectance unit. With this new technique, we can effectively improve the noise measurement accuracy by a factor of up to 500% for a photographic test pattern.

Citation Download Citation

Xiaofan Feng, John T. Newell, and Roger Triplett "Noise measurement technique for document scanners", Proc. SPIE 2654, Solid State Sensor Arrays and CCD Cameras, (25 March 1996); https://doi.org/10.1117/12.236113

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available