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A new optical technique allowing one to obtain quantitative information on the director field configuration in LC layers with 1D unhomogeneity of the general form is offered. The numerical simulation results demonstrating the potentialities of the offered optical technique are given.
Georgy V. Simonenko andDmitry A. Yakovlev
"New optical technique for determining director field configuration in inhomogeneous LC layers", Proc. SPIE 2731, International Liquid Crystal Workshop on Surface Phenomena, (19 January 1996); https://doi.org/10.1117/12.230670
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Georgy V. Simonenko, Dmitry A. Yakovlev, "New optical technique for determining director field configuration in inhomogeneous LC layers," Proc. SPIE 2731, International Liquid Crystal Workshop on Surface Phenomena, (19 January 1996); https://doi.org/10.1117/12.230670