Interferometry with respect to topological phases

Alexander V. Tavrov; Vladimir A. Andreev; Dmitry V. Ublinsky

doi:10.1117/12.243279

17 June 1996 Interferometry with respect to topological phases

Alexander V. Tavrov, Vladimir A. Andreev, Dmitry V. Ublinsky

Proceedings Volume 2763, Electro-Optical Technology for Remote Chemical Detection and Identification; (1996) https://doi.org/10.1117/12.243279
Event: Aerospace/Defense Sensing and Controls, 1996, Orlando, FL, United States

Abstract

Interferometry concept, that considers separately the phases: dynamical, Fresnel and topological has been elaborated. These phases have different origin. They are informative on specific properties of a sample, that is studied with an interferometer and a polarized light. Preliminary experiments have shown the confirmation of the role of topological phases in the interferogram formation. The concept has been applied to the micro-surface monitoring in real time.

Citation Download Citation

Alexander V. Tavrov, Vladimir A. Andreev, and Dmitry V. Ublinsky "Interferometry with respect to topological phases", Proc. SPIE 2763, Electro-Optical Technology for Remote Chemical Detection and Identification, (17 June 1996); https://doi.org/10.1117/12.243279

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