Measuring defect depths by thermal-wave imaging

Lawrence D. Favro; Xiaoyan Han; Pao-Kuang Kuo; Robert L. Thomas

doi:10.1117/12.235380

15 March 1996 Measuring defect depths by thermal-wave imaging

Lawrence D. Favro, Xiaoyan Han, Pao-Kuang Kuo, Robert L. Thomas

Proceedings Volume 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications; (1996) https://doi.org/10.1117/12.235380
Event: Aerospace/Defense Sensing and Controls, 1996, Orlando, FL, United States

Abstract

We describe a thermal wave technique for making defect depth determinations. Both theory and experiment are presented, and the results are compared. Examples of defects having different lateral dimensions and boundary conditions are given.

Citation Download Citation

Lawrence D. Favro, Xiaoyan Han, Pao-Kuang Kuo, and Robert L. Thomas "Measuring defect depths by thermal-wave imaging", Proc. SPIE 2766, Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (15 March 1996); https://doi.org/10.1117/12.235380

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